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Description
THBP209VIS M Dual Scanning Slit Beam Profiler, 200 1100 nm, Ø2.5 µm Ø9 mm, Metric subcategory_polishing pads This method of illumination produces This method of illumination produces a high level of resolution providing excellent detail of scratches and contamination MAX 730: Installation and maintenance OTDR designed to test through optical splitters (1x64) and short
Exchange/Return Notes
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THBP209VIS-M - Dual Scanning Slit Beam Profiler, 200 - 1100 nm, Ø2.5 µm - Ø9 mm, Metric subcategory_polishing-pads This method of illumination produces
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Ships within 48 hours · Estimated delivery Oct 26 - Oct 31